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original FT160 Series xrf analyzer High-Tech silicon drift detector for industrial use

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Attributes

30nmSpectral Bandwidth
X-Ray Spectrometertype
1Wavelength Resolution
Hawaii, United Statesplace of origin
1wavelength repeatability
OEMcustomized support
warranty:1 year
weight:1.5Kg
Selling Units:Single item
Single gross weight:25.000 kg

Key attributes

Spectral Bandwidth
30nm
type
X-Ray Spectrometer
Wavelength Resolution
1
place of origin
Hawaii, United States
wavelength repeatability
1
customized support
OEM
warranty
1 year
weight
1.5Kg

Packaging and delivery

Selling Units
Single item
Single gross weight
25.000 kg

Lead time

Product descriptions from the supplier

Minimum order quantity: 1 unit
$1,399

Variations

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Shipping

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